Characterizing Voltage Linearity and Leakage Current of...

IEEE Electron Device Letters 2011 / 03 Vol. 32; Iss. 3

Characterizing Voltage Linearity and Leakage Current of High Density $\hbox{Al}_{2}\hbox{O}_{3}/\hbox{HfO}_{2}/\hbox{Al}_{2}\hbox{O}_{3}$ MIM Capacitors

Lee, Sung Kyun, Kim, Kwan Soo, Kim, Soon-Wook, Lee, Dal Jin, Park, Sang Jong, Kim, Sibum
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2099200
Date:
March, 2011
File:
PDF, 440 KB
english, 2011
Conversion to is in progress
Conversion to is failed