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[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Compact Modeling of Stress Effects in Scaled CMOS

Wang, Chi-Chao, Zhao, Wei, Liu, Frank, Chen, Min, Cao, Yu
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Year:
2009
Language:
english
DOI:
10.1109/sispad.2009.5290231
File:
PDF, 363 KB
english, 2009
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