[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors
Sheng-Yi Huang,, Kun-Ming Chen,, Guo-Wei Huang,, Tsun-Lai Hsu,, Hua-Chou Tseng,, Chun-Yen Chang,Year:
2004
Language:
english
DOI:
10.1109/ipfa.2004.1345589
File:
PDF, 251 KB
english, 2004