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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Thermal characteristics of an advanced bMPI-based 1T-DRAM cell
Cheng-Hsin Chen,, Jyi-Tsong Lin,, Yi-Chuen Eng,, Hsien-Nan Chiu,, Tzu-Feng Chang,, Yi-Hsuan Fan,, Yu-Che Chang,, Kuan-Yu Lu,, Chih-Hsuan Tai,Year:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5532078
File:
PDF, 407 KB
english, 2010