Characterization of spatial homogeneity of sensitivity and...

Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range

P.N. Aruev, Yu.M. Kolokolnikov, N.V. Kovalenko, A.A. Legkodymov, V.V. Lyakh, A.D. Nikolenko, V.F. Pindyurin, V.L. Sukhanov, V.V. Zabrodsky
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Volume:
603
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2008.12.159
File:
PDF, 379 KB
english, 2009
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