![](/img/cover-not-exists.png)
[IEEE 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD '99 - Toronto, Ont., Canada (26-28 May 1999)] 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) - The effect of charge in junction termination extension passivation dielectrics
Trost, J.R., Ridley, R.S., Khan, M.K., Grebs, T., Evans, H., Arthur, S.Year:
1999
Language:
english
DOI:
10.1109/ispsd.1999.764094
File:
PDF, 381 KB
english, 1999