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[IEEE 2008 IEEE International Conference on Electro/Information Technology (EIT 2008) - Ames, IA, USA (2008.05.18-2008.05.20)] 2008 IEEE International Conference on Electro/Information Technology - On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering
Hanqing Xing,, Degang Chen,, Geiger, RandallYear:
2008
Language:
english
DOI:
10.1109/eit.2008.4554278
File:
PDF, 211 KB
english, 2008