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[IEEE 2009 WRI World Congress on Computer Science and Information Engineering - Los Angeles, California USA (2009.03.31-2009.04.2)] 2009 WRI World Congress on Computer Science and Information Engineering - The Embedded Product Testing Using Cleanroom Statistical Method
Fan, Lin, Wenhua, Zeng, Guowu, Chen, Yi, JiangYear:
2009
Language:
english
DOI:
10.1109/csie.2009.609
File:
PDF, 335 KB
english, 2009