The Punch-Through Effect in Silicon Strip Detectors

IEEE Transactions on Nuclear Science 2012 / 06 Vol. 59; Iss. 3

The Punch-Through Effect in Silicon Strip Detectors

Betancourt, C., Bielecki, A., Butko, Z., Deran, A., Ely, S., Fadeyev, V., Parker, C., Ptak, N., Sadrozinski, H. F.-W., Wright, J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2193418
Date:
June, 2012
File:
PDF, 1.67 MB
english, 2012
Conversion to is in progress
Conversion to is failed