Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2009 Vol. 610; Iss. 1
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Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process
V. Goiffon, P. Magnan, O. Saint-Pé, F. Bernard, G. RollandVolume:
610
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2009.05.078
File:
PDF, 359 KB
english, 2009