![](/img/cover-not-exists.png)
[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - Electrical characteristics of wedge-shaped gate-oxide in recessed-LOCOS
Young-Tag Woo,, Chi-Sun Hwang,, Sung-Joo Hong,, In-Sul Chung,Year:
1996
Language:
english
DOI:
10.1109/IRWS.1996.583380
File:
PDF, 449 KB
english, 1996