[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Defect filter for alternate RF test
Stratigopoulos, Haralampos-G., Mir, Salvador, Acar, Erkan, Ozev, SuleYear:
2010
Language:
english
DOI:
10.1109/etsym.2010.5512726
File:
PDF, 3.17 MB
english, 2010