![](/img/cover-not-exists.png)
[IEEE 2006 Design Automation Conference - San Francisco, CA, USA ()] 2006 43rd ACM/IEEE Design Automation Conference - Leakage-aware intraprogram voltage scaling for embedded processors
Po-Kuan Huang,, Ghiasi, S.Year:
2006
Language:
english
DOI:
10.1109/dac.2006.229301
File:
PDF, 4.07 MB
english, 2006