Eliminating threshold losses in MOS circuits by bootstrapping using varactor coupling
Joynson, R.E., Mundy, J.L., Burgess, J.F., Neugebauer, C.Volume:
7
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/jssc.1972.1050280
Date:
June, 1972
File:
PDF, 1.08 MB
english, 1972