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[IEEE 2012 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Bangkok, Thailand (2012.12.3-2012.12.5)] 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) - Linear analysis of closed loop capacitive accelerometer due to distance mismatch between plates
Huang Jingqing,, Zhao Meng,, Zhang Tingting,, Hong Lichen,, Wu Feng,, Zhang Yacong,, Lu Wengao,, Chen Zhongjian,, Hao Yilong,Year:
2012
Language:
english
DOI:
10.1109/EDSSC.2012.6482832
File:
PDF, 253 KB
english, 2012