[IEEE 2014 72nd Annual Device Research Conference (DRC) -...

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[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - InGaAs tri-gate MOSFETs with MOVPE regrown source/drain

Mishima, Yuichi, Kanazawa, Toru, Kinoshita, Haruki, Uehara, Eiji, Miyamoto, Yasuyuki
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Year:
2014
Language:
english
DOI:
10.1109/drc.2014.6872327
File:
PDF, 305 KB
english, 2014
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