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[IEEE 2006 IFIP International Conference on Very Large Scale Integration - Nice, France (2006.10.16-2006.10.18)] 2006 IFIP International Conference on Very Large Scale Integration - Design challenges for the 45 nm node and below
Schoellkopf, Jean-pierreYear:
2006
DOI:
10.1109/vlsisoc.2006.313274
File:
PDF, 177 KB
2006