[IEEE Conference on Precision Electromagnetic: Measurements - Washington, DC, USA (6-10 July 1998)] 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) - Low noise single electron transistors of stacked design
Krupenin, V.A., Presnov, D.E., Savvateev, M.N., Scherer, H., Zorin, A.B., Niemeyer, J.Year:
1998
Language:
english
DOI:
10.1109/CPEM.1998.699824
File:
PDF, 229 KB
english, 1998