[IEEE 2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010) - Rome, Italy (2010.09.5-2010.09.10)] 35th International Conference on Infrared, Millimeter, and Terahertz Waves - Neural Network-based non-destructive quantification of thin coating by terahertz pulsed imaging in the frequency domain
Zhong, Shuncong, Shen, Yaochu, Evans, Michael J., May, Robert K., Zeitler, J. Axel, Dey, DipankarYear:
2010
Language:
english
DOI:
10.1109/icimw.2010.5612560
File:
PDF, 685 KB
english, 2010