[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Power integrity control of ATE for emulating power supply fluctuations on customer environment
Ishida, Masahiro, Nakura, Toru, Kikkawa, Toshiyuki, Kusaka, Takashi, Komatsu, Satoshi, Asada, KunihiroYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401553
File:
PDF, 726 KB
english, 2012