[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - A thermoreflectance thermography system for measuring the transient surface temperature field of activated electronic devices
Komarov, P.L., Burzo, M.G., Raad, P.E.Year:
2006
Language:
english
DOI:
10.1109/stherm.2006.1625228
File:
PDF, 748 KB
english, 2006