![](/img/cover-not-exists.png)
[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Radiation damage characterization of digital integrated circuits
Sondon, Santiago, Mandolesi, Pablo, Julian, Pedro, Palumbo, Felix, Alurralde, Martin, Filevich, AlbertoYear:
2009
Language:
english
DOI:
10.1109/latw.2009.4813811
File:
PDF, 5.14 MB
english, 2009