Study of wide band gap nanocrystalline silicon carbide...

Study of wide band gap nanocrystalline silicon carbide films for radiation imaging detectors

J. Huran, B. Zat'ko, P. Boháček, V.N. Shvetsov, A.P. Kobzev
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Volume:
633
Year:
2011
Language:
english
Pages:
1
DOI:
10.1016/j.nima.2010.06.127
File:
PDF, 206 KB
english, 2011
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