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[IEEE ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. - San Jose, CA (Nov. 6-10, 2005)] ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. - Simulation-based bug trace minimization with BMC-based refinement
Kai-hui Chang,, Bertacco, V., Markov, I.L.Year:
2005
Language:
english
DOI:
10.1109/iccad.2005.1560216
File:
PDF, 384 KB
english, 2005