An experimental study of single-event effects induced in commercial SRAMs by neutrons and protons from thermal energies to 500 MeV
Dyer, C.S., Clucas, S.N., Sanderson, C., Frydland, A.D., Green, R.T.Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.835083
Date:
October, 2004
File:
PDF, 205 KB
english, 2004