[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Negative U traps in HfO/sub 2/ gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
Shen, C., Li, M.F., Wang, X.P., Yu, H.Y., Feiig, Y.P., Lim, A.T.-L., Yeo, Y.C., Chan, D.S.H., Kwong, D.L.Year:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419275
File:
PDF, 321 KB
english, 2004