Heavy-ion test of detectors with conventional and resistive...

Heavy-ion test of detectors with conventional and resistive Micromegas used in TPC configuration

Jean-Éric Ducret, Philippe Legou, Jerzy łukasik, Alain Boudard, Michel Combet, BronisŁaw Czech, Robert Durand, Thomas Gorbinet, Pascal Le Bourlout, Sylvie Leray, Vladislav Matousek, François Nizery, P
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Volume:
628
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.nima.2010.06.309
File:
PDF, 1.14 MB
english, 2011
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