A system for characterization of DEPFET silicon pixel...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2011 Vol. 628; Iss. 1

A system for characterization of DEPFET silicon pixel matrices and test beam results

Sergey Furletov
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Volume:
628
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2010.06.322
File:
PDF, 837 KB
english, 2011
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