The first beam test of a monolithic particle pixel detector...

The first beam test of a monolithic particle pixel detector in high-voltage CMOS technology

I. Perić, C. Takacs, J. Behr, F.M. Wagner, P. Fischer
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Volume:
628
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2010.06.337
File:
PDF, 470 KB
english, 2011
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