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[IEEE 20th International Reliability Physics Symposium - San Diego, NV, USa (1982.03.30-1982.04.1)] 20th International Reliability Physics Symposium - A New Liquid Crystal for Field-Effect Viewing of 5V Vcc CMOS Logic Families
Crow, M. D., George, E. W., Lowry, R. K.Year:
1982
Language:
english
DOI:
10.1109/irps.1982.363040
File:
PDF, 5.53 MB
english, 1982