[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Design for self-checking and self-timed datapath
Jing-ling Yang,, Chiu-sing Choy,, Cheong-fat Chan,, Kong-pong Pun,Year:
2003
DOI:
10.1109/vtest.2003.1197683
File:
PDF, 602 KB
2003