[IEEE 2000 Symposium on VLSI Circuits. Digest of Technical Papers - Honolulu, HI, USA (15-17 June 2000)] 2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103) - A new model for thermal channel noise of deep submicron MOSFETs and its application in RF-CMOS design

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