A 32 channel TDC on a VME board
Bassini, R., Boiano, C., Brambilla, S., Carriero, C., Malatesta, M.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682651
Date:
June, 1998
File:
PDF, 476 KB
english, 1998