[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Cathodoluminescence evaluation of electrical stress condition of Si-SiO/sub 2/ structures
Liu, X., Chan, D.S.H., Phang, J.C.H., Chim, W.K.Year:
1997
Language:
english
DOI:
10.1109/ipfa.1997.638345
File:
PDF, 427 KB
english, 1997