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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Generalized Recognition Of Gates: a VLSI abstraction tool
Guignet, J.B.Year:
1996
Language:
english
DOI:
10.1109/edtc.1996.494372
File:
PDF, 101 KB
english, 1996