Pulse-Vanishing Test for Interposers Wires in 2.5-D IC

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2014 / 8 Vol. 33; Iss. 8

Pulse-Vanishing Test for Interposers Wires in 2.5-D IC

Huang, Shi-Yu, Lee, Jeo-Yen, Tsai, Kun-Han, Cheng, Wu-Tung
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Volume:
33
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2014.2316093
Date:
August, 2014
File:
PDF, 3.04 MB
english, 2014
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