[Inst. Electr. Eng. Japan 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 - Osaka, Japan (4-7 June 2001)] Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) - Improvement of breakdown characteristics of LDMOSFETs with uneven racetrack sources for PDP driver applications
Tae Moon Roh,, Dae Woo Lee,, Jongdae Kim,, Jin Gun Koo,, Kyoung-Ik Cho,Year:
2001
Language:
english
DOI:
10.1109/ispsd.2001.934581
File:
PDF, 355 KB
english, 2001