[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - Compact precharging-transistor-less dynamic circuits for high noise-immunity applications
Chung-Hsun Huang,, Tzung-Lin Wu,, Yi-Ming Wang,Year:
2010
Language:
english
DOI:
10.1109/VDAT.2010.5496740
File:
PDF, 358 KB
english, 2010