![](/img/cover-not-exists.png)
[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Sampling circuits that break the kT/C thermal noise limit
Kapusta, Ron, Zhu, Haiyang, Lyden, ColinYear:
2013
Language:
english
DOI:
10.1109/CICC.2013.6658440
File:
PDF, 295 KB
english, 2013