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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique
Gu, S.H., Wang, M.T., Chan, C.T., Zous, N.K., Yeh, C.C., Tsai, W.J., Lu, T.C., Tahui Wang,, Ku, J., Chih-Yuan Lu,Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315428
File:
PDF, 160 KB
english, 2004