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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms
Lisboa, Carlos Arthur Lang, Argyrides, Costas, Pradhan, Dhiraj Kumar, Carro, LuigiYear:
2008
Language:
english
DOI:
10.1109/vts.2008.29
File:
PDF, 371 KB
english, 2008