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[IEEE 2002 2nd IEEE Conference on Nanotechnology - Washington, DC, USA (26-28 Aug. 2002)] Proceedings of the 2nd IEEE Conference on Nanotechnology - High yield non destructive purification of single wall carbon nanotubes monitored by EPR measurements
Capes, L., Valentin, E., Esnouf, S., Ribayrol, A., Jost, O., Filoramo, A., Patillon, J.-N.Year:
2002
Language:
english
DOI:
10.1109/nano.2002.1032284
File:
PDF, 295 KB
english, 2002