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[IEEE Comput. Soc Design, Automation and Test in Europe - Paris, France (23-26 Feb. 1998)] Proceedings Design, Automation and Test in Europe - Analog test design with I/sub DD/ measurements for the detection of parametric and catastrophic faults
Lindermeir, W.M., Vogels, T.J., Graeb, H.E.Year:
1998
Language:
english
DOI:
10.1109/date.1998.655953
File:
PDF, 195 KB
english, 1998