Analysis of transient ion beam induced current in Si PIN...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2005 Vol. 231; Iss. 1-4

Analysis of transient ion beam induced current in Si PIN photodiode

Shinobu Onoda, Toshio Hirao, Jamie Stuart Laird, Tsuyoshi Okamoto, Yoshiharu Koizumi, Tomihiro Kamiya
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
231
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2005.01.106
File:
PDF, 292 KB
english, 2005
Conversion to is in progress
Conversion to is failed