[IEEE 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2014.5.19-2014.5.21)] 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) - Advanced soft fail characterization methodology for sub-28nm nanoscale SRAM yield improvement
Jianhua Yin,, Fernandes, Sherwin, Yinzhe Ma,, Sheng Xie,, Xuemei Liu,, Qiushi Wang,, Dexter, Mark, Meixiong Zhao,, Mann, Randy, Chong Khiam Oh,, Tay, Mark, Lim, Seng Keat, Dapeng Sun,, Chao, PYear:
2014
Language:
english
DOI:
10.1109/asmc.2014.6846953
File:
PDF, 733 KB
english, 2014