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[IEEE 64th ARFTG Microwave Measurements Conference, Fall 2004. - Orlando, FL, USA (Dec. 2-3, 2004)] 64th ARFTG Microwave Measurements Conference, Fall 2004. - Impact of ground line position on CMOS interconnect behavior
Faiez Ktata, M., Arz, U., Grabinski, H., Fischer, H.Year:
2004
Language:
english
DOI:
10.1109/arftgf.2004.1427600
File:
PDF, 754 KB
english, 2004