Determination of nitrogen-related defects in N-implanted...

Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence

Y.F. Mei, G.G. Siu, Ricky K.Y. Fu, K.W. Wong, Paul K. Chu, C.W. Lai, H.C. Ong
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Volume:
237
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2005.05.005
File:
PDF, 914 KB
english, 2005
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