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[IEEE 2009 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Taipei, Taiwan (2009.11.16-2009.11.18)] 2009 IEEE Asian Solid-State Circuits Conference - A Wafer test method of inductive-coupling link
Kasuga, Kazutaka, Saito, Mitsuko, Takeya, Tsutomu, Miura, Noriyuki, Ishikuro, Hiroki, Kuroda, TadahiroYear:
2009
Language:
english
DOI:
10.1109/asscc.2009.5357251
File:
PDF, 1.24 MB
english, 2009