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Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD
Babcock, J.A., Cressler, J.D., Vempati, L.S., Clark, S.D., Jaeger, R.C., Harame, D.L.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488750
Date:
January, 1995
File:
PDF, 1.08 MB
english, 1995