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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: A complete model
Meneghini, Matteo, Stocco, Antonio, Bertin, Marco, Ronchi, Nicolo, Chini, Alessandro, Marcon, Denis, Meneghesso, Gaudenzio, Zanoni, EnricoYear:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131586
File:
PDF, 378 KB
english, 2011